Infrared surface analysis using a newly developed thin-sample preparation system.

We developed a new sampling system, the Nano Catcher, for measuring the surface chemical structure of polymers or industrial products and we evaluated the performance of the system. The system can directly pick up surface species whose depth is on the order of approximately 100 nm and can easily provide a sample for a Fourier transform infrared (FT-IR) system without the necessity of passing it over to a measurement plate. The FT-IR reflection data obtained from the Nano Catcher were compared with those obtained using the attenuated total reflection (ATR) method and sampling by hand.