GaN and hybrid organic-inorganic perovskites like MAPbI are key materials in optoelectronics, influencing fields such as solid-state lighting, high-power electronics, and photovoltaics.
The study investigates carrier transfer across the MAPbI/GaN interface using contactless electroreflectance, revealing how MAPbI affects the Fermi level position at the surface of GaN.
Findings indicate that MAPbI shifts the Fermi level deeper in the GaN bandgap, with n-type GaN transferring carriers to MAPbI and p-type GaN receiving carriers from it; the research also presents a self-powered photodetector based on the MAPbI/GaN interface.
Hexagonal boron nitride (h-BN) has gained attention for its potential in various applications, especially in devices that incorporate h-BN/III-V junctions like light emitters and transistors.
This study focuses on the electronic interactions at the h-BN/GaN interface using contactless electroreflectance (CER) spectroscopy, a non-destructive technique that helps measure the Fermi level and examine charge transport.
Findings indicate that h-BN increases the surface barrier height of GaN and causes the Fermi level to pin deeper in the band gap, which is attributed to electron transfer from GaN surface states to h-BN’s acceptor states; the study also validates CER as a reliable method for