Extended utilization of a Ge/Ga reference source as a mock F source in the ionization chamber calibration.

Possible extended utilization of a Ge/Ga source as a surrogate F reference source was studied. Some effects and uncertainties might arise from the difference of constructions between chambers that were used in the source calibration and those practically in use. To extend utilization of the surrogate source, response ratio of real F to Ge/Ga sources were determined for three models of chambers.