Engineering of Interface Barrier in Hybrid MXene/GaN Heterostructures for Schottky Diode Applications.

The Fermi level position at the interface of a heterostructure is a critical factor for device functionality, strongly influenced by surface-related phenomena. In this study, contactless electroreflectance (CER) was utilized for the first time to investigate the built-in electric field in MXene/GaN structures with the goal of understanding the carrier transfer across the MXene/GaN interface. Five MXenes with high work functions were examined: CrC, MoC, VC, VC, and TiC.