Simulating 50 keV X-ray Photon Detection in Silicon with a Down-Conversion Layer.

Simulation results are presented that explore an innovative, new design for X-ray detection in the 20-50 keV range that is an alternative to traditional direct and indirect detection methods. Typical indirect detection using a scintillator must trade-off between absorption efficiency and spatial resolution. With a high-Z layer that down-converts incident photons on top of a silicon detector, this design has increased absorption efficiency without sacrificing spatial resolution.