Publications by authors named "Kai A Schwenzfeier"

Controlling polymer-metal adhesion is critical in ensuring that materials can be cleanly separated during production processes without residue, which is crucial for various industrial applications. Accurately characterizing adhesion on industrial-grade surfaces is complex due to factors like surface roughness and actual contact area between surfaces and the polymer. In this study, we quantified the adhesive behavior of stainless-steel samples with varying surface treatments against a polymer using the surface forces apparatus (SFA) in reflection geometry, as well as X-ray photoelectron spectroscopy (XPS).

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After almost 35 years of truly successful and transformative advancements, Atomic Force Microscopy (AFM) and, in general, scanning probe microscopy still have a fundamental limitation. This is constant drift and uncontrolled motion of probe and tested surface structures with respect to each other. This is inherently linked to the currently accepted design principle-only forces are measured, and distances are inferred from force measurements and piezo motions.

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Multiple beam interferometry (MBI) evolved as a powerful tool for the simultaneous evaluation of thin film thicknesses and refractive indices in Surface Forces Apparatus (SFA) measurements. However, analysis has relied on simplifications for providing fast or simplified analysis of recorded interference spectra. Here, we describe the implementation of new optics and a generalized fitting approach to 4 × 4 transfer matrix method simulations for the SFA.

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