Within the presented work, we propose a complex photoemission-based approach for the investigation of the CThSe dyad (CThSe)/indium-tin oxide (ITO) interface formation. For surface topography and basic morphology determination, atomic force microscopy was utilized, and the results showed that CThSe agglomerated into close-to-spherical crystallites and the island-like growth was the dominant type for fullerene growth on the ITO substrate. Further, detailed X-ray and UV-photoelectron spectroscopies (XPS, UPS) were used for thorough characterization of the chemical and electronic properties of the investigated structures.
View Article and Find Full Text PDFJ Phys Chem C Nanomater Interfaces
June 2021