Publications by authors named "Jun-Tong Feng"

The SEM image data presented in this article was collected by the Scanning electron microscopy (SEM) performed on an XL-30 ESEM FEG scanning electron microscopy. The diameter stastics data was collected and calculated by the Image-Pro Plus software system. The UV-Vis Res spectrum was collected by solid state UV diffuse reflector Shimadzu UV-4100 at wavelength 200-800 nm.

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