Spiral Annealing of Magnetic Microwires.

A preprocessing technique named "spiral annealing" was applied for the first time to magnetic microwires. In this process, the sample was arranged in a flat spiral shape during annealing, and subsequent measurements were conducted on the unbent sample with the induced stress distribution along and transverse to the sample. The research utilized both magnetic and magneto-optical methods.

Monitoring the Velocity of Domain Wall Motion in Magnetic Microwires.

An approach was proposed to control the displacement of domain walls in magnetic microwires, which are employed in magnetic sensors. The velocity of the domain wall can be altered by the interaction of two magnetic microwires of distinct types. Thorough investigations were conducted utilizing fluxmetric, Sixtus-Tonks, and magneto-optical techniques.

Determination of Magnetic Structures in Magnetic Microwires with Longitudinally Distributed Magnetic Anisotropy.

We studied the magnetic properties of a glass-covered amorphous microwire that was stress-annealed at temperatures distributed along the microwire length. The Sixtus-Tonks, Kerr effect microscopy and magnetic impedance techniques have been applied. There was a transformation of the magnetic structure across the zones subjected to annealing at different temperatures.

Reversible and Non-Reversible Transformation of Magnetic Structure in Amorphous Microwires.

We provide an overview of the tools directed to reversible and irreversible transformations of the magnetic structure of glass-covered microwires. The irreversible tools are the selection of the chemical composition, geometric ratio, and the stress-annealing. For reversible tuning we use the combination of magnetic fields and mechanical stresses.

Magnetic Characterization in the Rayleigh Region of Nanocrystalline Magnetic Cores.

We report on the structural and magnetic characterization of two nanocrystalline Finemet-type magnetic cores. The nanocrystalline structure developed after annealing the amorphous precursor alloy at 550 °C for 30 and 60 min of annealing time. Structural analysis carried out by means of X-ray diffraction providing useful information on the grain size mean and partial volume of the nanocrystalline phase.