Sizing Subwavelength Defects With Ultrasonic Imagery: An Assessment of Super-Resolution Imaging on Simulated Rough Defects.

There is a constant drive within the nuclear power industry to improve upon the characterization capabilities of current ultrasonic inspection techniques in order to improve safety and reduce costs. Particular emphasis has been placed on the ability to characterize very small defects which could result in extended component lifespan and help reduce the frequency of in-service inspections. Super-resolution (SR) algorithms, also known as sampling methods, have been shown to demonstrate the capability to resolve scatterers separated by less than the diffraction limit when deployed in representative inspections and therefore could be used to tackle this issue.