In Situ Focused Ion Beam Redeposition Surface Coatings for Site-Specific, Near-Surface Characterization by Atom Probe Tomography.

Atom probe tomography (APT) enables three-dimensional chemical mapping with near-atomic scale resolution. However, this method requires precise sample preparation, which is typically achieved using a focused ion beam (FIB) microscope. As the ion beam induces some degree of damage to the sample, it is necessary to apply a protective layer over the region of interest (ROI).

Interfacial Segregation of Sn during the Continuous Annealing and Selective Oxidation of Fe-Mn-Sn Alloys.

The effect of Mn on interfacial Sn segregation during the selective oxidation of Fe-(0-10)Mn-0.03Sn (at.%) alloys was determined for annealing conditions compatible with continuous galvanizing.

Process Maps for Predicting Austenite Fraction (vol.%) in Medium-Mn Third-Generation Advanced High-Strength Steels.

Process maps were developed using a combination of microstructural analysis and DICTRA-based modeling to predict the austenite vol.% as a function of the intercritical annealing parameters and starting microstructure. The maps revealed a strong dependence of the calculated austenite fraction (vol.