A network modeling approach provides insights into the environment-specific yield architecture of wheat.

Wheat (Triticum aestivum) yield is impacted by a diversity of developmental processes which interact with the environment during plant growth. This complex genetic architecture complicates identifying quantitative trait loci that can be used to improve yield. Trait data collected on individual processes or components of yield have simpler genetic bases and can be used to model how quantitative trait loci generate yield variation.