Measurement of static and vibration-induced phase noise in UHF thin-film resonator (TFR) filters.

Measurements of the static phase noise and vibration sensitivity of thin-film resonator (TFR) filters operating at 640 and 2110 MHz have been made. They show that the short-term frequency instability of the filters is small compared with that induced in the oscillator signal by the sustaining stage amplifier PM (phase modulation) noise. In-oscillator measurement of filter performance under vibration indicates that fractional frequency vibration sensitivities (deltafo/fo) are on the order of several parts in 10(-9)/g.