Publications by authors named "Jose Reinaldo Cavalcanti de Queiroz"
Silicon-based film on the yttria-stabilized tetragonal zirconia polycrystal: Surface and shear bond strength analysis.
Alecsandro de Moura Silva Viviane Maria Gonçalves de Figueiredo Marcos Massi Renata Falchete do Prado Argemiro Soares da Silva Sobrinho José Reinaldo Cavalcanti de Queiroz
J Investig Clin Dent
November 2019
Aim: To analyze the effect of a silicon (Si)-based film deposited on yttria-stabilized tetragonal zirconia polycrystal (Y-TZP) on the topography and bond strength of resin cement.
Methods: Specimens of zirconia were obtained and randomly divided into 4 groups, according to surface treatment: polished group (PG) zirconia; sandblasted group (SG) zirconia with aluminum oxide (100 µm); after polished, zirconia was coated with Si-based film group (SiFG); and after sandblasted, zirconia was coated with Si-based film group (SiFSG). The Si-based films were obtained through plasma-enhanced chemical vapor deposition.