Publications by authors named "Jonathan Barreaux"
Article Synopsis
- This study focuses on improving spectral purity in extreme ultraviolet (EUV) and soft X-ray optical systems, typically a trade-off for efficiency.
- Researchers developed a new technique using a periodic, tapered structure combined with an EUV multilayer, which effectively scatters longer wavelength radiation while allowing EUV light to be reflected.
- Initial results demonstrated a significant broadband suppression of wavelengths from 100-400 nm, achieving an average suppression factor of 14 and a high EUV reflectance of 64.7%, which is close to the efficiency of standard EUV multilayer mirrors.
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