Improved simulation based HR-EBSD procedure using image gradient based DIC techniques.

Conventional HR-EBSD is attracting much interest due to its ability of measuring relative crystal misorientations and microstresses with great accuracy. However, this technique needs the use of simulated patterns in order to get absolute values of crystal orientation and stresses and thus expand its use to intergranular analyses. Simulation-based approaches have shown many limitations due to the poor correlation with the real patterns specially when Bragg simulations are considered.

Limits of simulation based high resolution EBSD.

High resolution electron backscattered diffraction (HREBSD) is a novel technique for a relative determination of both orientation and stress state in crystals through digital image correlation techniques. Recent works have tried to use simulated EBSD patterns as reference patterns to achieve the absolute orientation and stress state of crystals. However, a precise calibration of the pattern centre location is needed to avoid the occurrence of phantom stresses.