Two-edge-resolved three-dimensional non-line-of-sight imaging with an ordinary camera.

We introduce an approach for three-dimensional full-colour non-line-of-sight imaging with an ordinary camera that relies on a complementary combination of a new measurement acquisition strategy, scene representation model, and tailored reconstruction method. From an ordinary photograph of a matte line-of-sight surface illuminated by the hidden scene, our approach reconstructs a three-dimensional image of the scene hidden behind an occluding structure by exploiting two orthogonal edges of the structure for transverse resolution along azimuth and elevation angles and an information orthogonal scene representation for accurate range resolution. Prior demonstrations beyond two-dimensional reconstructions used expensive, specialized optical systems to gather information about the hidden scene.

Compressively sampling the optical transmission matrix of a multimode fibre.

The measurement of the optical transmission matrix (TM) of an opaque material is an advanced form of space-variant aberration correction. Beyond imaging, TM-based methods are emerging in a range of fields, including optical communications, micro-manipulation, and computing. In many cases, the TM is very sensitive to perturbations in the configuration of the scattering medium it represents.

Seeing around corners with edge-resolved transient imaging.

Non-line-of-sight (NLOS) imaging is a rapidly growing field seeking to form images of objects outside the field of view, with potential applications in autonomous navigation, reconnaissance, and even medical imaging. The critical challenge of NLOS imaging is that diffuse reflections scatter light in all directions, resulting in weak signals and a loss of directional information. To address this problem, we propose a method for seeing around corners that derives angular resolution from vertical edges and longitudinal resolution from the temporal response to a pulsed light source.

Source shot noise mitigation in focused ion beam microscopy by time-resolved measurement.

Focused ion beam microscopy suffers from source shot noise - random variation in the number of incident ions in any fixed dwell time - along with random variation in the number of detected secondary electrons per incident ion. This multiplicity of sources of randomness increases the variance of the measurements and thus worsens the trade-off between incident ion dose and image accuracy. Repeated measurement with low dwell time, without changing the total ion dose, is a way to introduce time resolution to this form of microscopy.

Computational periscopy with an ordinary digital camera.

Computing the amounts of light arriving from different directions enables a diffusely reflecting surface to play the part of a mirror in a periscope-that is, perform non-line-of-sight imaging around an obstruction. Because computational periscopy has so far depended on light-travel distances being proportional to the times of flight, it has mostly been performed with expensive, specialized ultrafast optical systems. Here we introduce a two-dimensional computational periscopy technique that requires only a single photograph captured with an ordinary digital camera.