Publications by authors named "John L Bost"
Article Synopsis
- Plasmon decay is a key process that helps transfer hot carriers between plasmonic nanoparticles and semiconductor surfaces, which could enhance electronic applications.
- The study employs real-time time-dependent density functional theory (RT-TDDFT) simulations, revealing that plasmon decay in silver (Ag) nanoparticles on hydrogen-terminated Si(111) surfaces occurs over 100 femtoseconds, and is over twice as fast compared to free space.
- The simulations show that this rapid plasmon decay generates nearly 30% of holes deep in the semiconductor's valence band, highlighting the usefulness of the Wannier gauge approach for studying complex electron dynamics.
The title compounds, [Mo(CH)(COCH)(CHNP)(CO)], (1), and [Mo(CH)(COCH)(CHNOP)(CH)))(CO)], (2), have been prepared by phosphine-induced migratory insertion from [Mo(CH)(CO)(CH)]. The mol-ecular structures of these complexes are quite similar, exhibiting a four-legged piano-stool geometry with -disposed carbonyl ligands. The extended structures of complexes (1) and (2) differ substanti-ally.
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