Publications by authors named "John K Essel"

From literature, majority of face recognition modules suffer performance challenges when presented with test images acquired under multiple constrained environments (occlusion and varying expressions). The performance of these models further deteriorates as the degree of degradation of the test images increases (relatively higher occlusion level). Deep learning-based face recognition models have attracted much attention in the research community as they are purported to outperform the classical PCA-based methods.

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