Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction.

Dark-field X-ray microscopy (DFXM) is a high-resolution, X-ray-based diffraction microstructure imaging technique that uses an objective lens aligned with the diffracted beam to magnify a single Bragg reflection. DFXM can be used to spatially resolve local variations in elastic strain and orientation inside embedded crystals with high spatial (~ 60 nm) and angular (~ 0.001°) resolution.

Interaction of Glide Dislocations with Extended Precipitates in Mg-Nd alloys.

The unit processes of precipitate-dislocation interaction in dilute Mg-Nd alloys are elucidated through in situ indentation experiments in TEM. Results suggest that pinned dislocations can glide along the broad facets of extended β precipitates, a common strengthening phase in Mg- rare earth (RE) alloys. A dislocation-theory based analysis suggests that the shape, spacing and orientation (with respect to the glide plane) of β precipitates may favor glide of pinned dislocations along interfaces as opposed to the classical mechanism of bowing and looping around the precipitate.