EBIT Observation of Ar Dielectronic Recombination Lines near the Unknown Faint X-Ray Feature Found in the Stacked Spectrum of Galaxy Clusters.

Motivated by possible atomic origins of the unidentified emission line detected at 3.55-3.57 keV in a stacked spectrum of galaxy clusters, an electron beam ion trap (EBIT) was used to investigate the resonant dielectronic recombination (DR) process in highly charged argon ions as a possible contributor to the emission feature.

Analysis of EUV spectra from N-shell tungsten ions observed with an electron beam ion trap.

Extreme ultraviolet spectra of highly charged tungsten ions were produced with an electron beam ion trap at the National Institute of Standards and Technology and recorded with a flat-field grazing-incidence spectrometer. The spectra were measured in the wavelength range 2.7-17.

Identification and Plasma Diagnostics Study of Extreme Ultraviolet Transitions in Highly Charged Yttrium.

Extreme ultraviolet spectra of the L-shell ions of highly charged yttrium were observed in the electron beam ion trap of the National Institute of Standards and Technology using a flat-field grazing-incidence spectrometer in the wavelength range of 4 nm-20 nm. The electron beam energy was systematically varied from 2.3 keV-6.