The X-ray dark-field signal can be measured with a grating-based Talbot-Lau interferometer. It measures small angle scattering of micrometer-sized oriented structures. Interestingly, the signal is a function not only of the material, but also of the relative orientation of the sample, the X-ray beam direction, and the direction of the interferometer sensitivity.
View Article and Find Full Text PDFInt J Comput Assist Radiol Surg
January 2019
Purpose: Two phase gratings in an X-ray grating interferometers can solve several technical challenges for clinical use of X-ray phase contrast. In this work, we adapt and evaluate this setup design to clinical X-ray sources and detectors in a simulation study.
Methods: For a given set of gratings, we optimize the remaining parameter space of a dual-phase grating setup using a numerical wave front simulation.