Publications by authors named "Jill E Headrick"
An alternative method for fabricating functionalized, atomic force microscopy (AFM) tips is presented. This technique is simple and requires only minimal preparation and tip modification to generate chemically sensitive probes that have a robust organic monolayer of flexible terminal chemistry attached to the surface. Specifically, commercially microfabricated Si3N4 AFM tips were modified with self-assembled monolayers (SAMs) of octadecyltrichlorosilane and (11-bromoundecyl)trichlorosilane after removing the native silicon oxide surface layer with concentrated hydrofluoric acid.
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- Researchers successfully used an atomic force microscope (AFM) to create nanometer-scale patterns in self-assembled monolayers (SAMs) made from 1-alkenes on hydrogen-passivated silicon substrates.
- The technique, known as nanoshaving, demonstrates both flexibility and effectiveness in forming well-defined nanoscale features in a controlled way.
- By adjusting the applied load and the number of etching scans, they achieved features with varying depths ranging from 2 to 15 nm, while also comparing the results with patterns created on different surfaces like silicon and mica.