Group delay dispersion monitoring for computational manufacturing of dispersive mirrors.

We present a computational manufacturing program for monitoring group delay dispersion (GDD). Two kinds of dispersive mirrors computational manufactured by GDD, broadband, and time monitoring simulator are compared. The results revealed the particular advantages of GDD monitoring in dispersive mirror deposition simulations.

Statistical information enhanced robust design method of optical thin film.

A novel merit function was constructed using the spectral coefficient average error and standard deviation, which can simultaneously optimize the expectation of spectral coefficient error and the envelope of standard deviation. Thus, a multi-objective optimization strategy based on Non-Dominated Sorting Genetic Algorithm and Sequential quadratic programming was proposed. By comparing result of wideband anti-reflection film, cut-off filter and Infrared dual-band filter designed by the conventional algorithm and the new algorithm, the control effect of the new algorithm on sensitivity of film parameters error was verified.