[Boundary threshold value method used in crystalline material internal defect detection by short wavelength X-ray diffraction].

There are few references about crystalline material internal defect detected by X-ray diffraction tomography using common X-ray source. Short wavelength X-ray diffractometer (SWXRD), invented by Institute of Southwest Technology Engineering, is a relatively small and inexpensive instrument compared to synchrotron radiation or neutron reactor. Boundary determination of defect affects the imaging quality and the distinguishing of defect in X-ray diffraction tomography using SWXRD.