Automation of an atomic force microscope via Arduino.

The Atomic Force Microscopy is a very versatile technique that allows to characterize surfaces by acquiring topographies with sub-nanometer resolution. This technique often overcomes the problems and capabilities of electron microscopy when characterizing few nanometers thin coatings over solid substrates. They are expensive, in the half million dollar range for standard units, and therefore it is often difficult to upgrade to new units with improved characteristics.