X-ray inspection systems are critical in medical, non-destructive testing, and security applications, with systems typically measuring attenuation along straight-line paths connecting sources and detectors. Computed tomography (CT) systems can provide higher-quality images than single- or dual-view systems, but the need to measure many projections leads to greater system cost and complexity. Typically, off-angle Compton scattered photons are treated as noise during tomographic inversion.
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