Publications by authors named "Jeffrey Irion"

The final aperture superposition technique (FAST) is a method to reproduce rapidly the electron-beam depth dose curves and output factors that would be calculated by a full Monte Carlo simulation. FAST uses precalculated Monte Carlo-based differential dose arrays and performs a superposition of open and shielded contributions to account for arbitrarily shaped insert openings. The objective of this work was to refine and validate the accuracy of the FAST method for a full range of treatment parameters.

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