Single-scan interferometric second harmonic generation microscopy using a kHz phase-scanner.

In conventional laser-scanning microscopy, images are formed by acquiring the signal from pixel to pixel. Here, we report more than one order of magnitude reduction in acquisition time of Interferometric Second Harmonic Generation (I-SHG) by scanning the phase within each pixel, to characterize the relative polarity of various samples. Using an electro-optic phase-scanner, we show that the phase-shift patterns required for interferometry can be applied at each pixel during the scanning of the sample, allowing single-scan I-SHG (1S-ISHG) measurements.