Synopsis of recent research by authors named "Jasmin Ehrler"
- Jasmin Ehrler's research primarily focuses on the application of magnetic force microscopy (MFM) to characterize magnetic properties while addressing challenges posed by additional forces, such as electrostatic forces.
- One of her notable studies examines how the thickness and roughness of dielectric layers can influence topographic effects in MFM, aiming to improve the resolution and accuracy of measurements.
- The findings suggest that optimizing dielectric layer characteristics can significantly reduce capacitive coupling effects, thereby enhancing the quality of magnetic signals obtained during microscopy.
