Effect of refractive index mismatch on forward-to-backward ratios in SHG imaging.

Nonlinear optical imaging in the epi-direction is used to image subresolution features. We find that a refractive index mismatch between the object to be imaged and the background medium can change the far-field intensity image. As an example, we study second harmonic generation (SHG) microscopy where the forward-to-backward (F/B) ratio is used to quantify subresolution features.

Gouy phase shift measurement using interferometric second-harmonic generation.

We report on a simple way to directly measure the Gouy phase shift of a strongly focused laser beam. This is accomplished by using a recent technique, namely, interferometric second-harmonic generation. We expect that this method will be of interest in a wide range of research fields, from high-harmonic and attosecond pulse generation to femtochemistry and nonlinear microscopy.