In this study, daily changes over a short period and diurnal progression of spectral reflectance at the leaf level were used to identify spring wheat genotypes ( L.) susceptible to adverse conditions. Four genotypes were grown in pots experiments under semi-controlled conditions in Chile and Spain.
View Article and Find Full Text PDFLeaf area index (LAI) is one of the key biophysical variables required for crop modeling. Direct LAI measurements are time consuming and difficult to obtain for experimental and commercial fruit orchards. Devices used to estimate LAI have shown considerable errors when compared to ground-truth or destructive measurements, requiring tedious site-specific calibrations.
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