Dynamic control and manipulation of near-fields using direct feedback.

Shaping and controlling electromagnetic fields at the nanoscale is vital for advancing efficient and compact devices used in optical communications, sensing and metrology, as well as for the exploration of fundamental properties of light-matter interaction and optical nonlinearity. Real-time feedback for active control over light can provide a significant advantage in these endeavors, compensating for ever-changing experimental conditions and inherent or accumulated device flaws. Scanning nearfield microscopy, being slow in essence, cannot provide such a real-time feedback that was thus far possible only by scattering-based microscopy.