Publications by authors named "Jaap Kautz"
Article Synopsis
- Charge transport in many systems is influenced more by local features than by a single resistance measure, making understanding local electronic potential crucial for device analysis.
- A new low-energy electron microscopy (LEEM) potentiometry method has been developed that is fast, non-invasive, and allows for easy zooming and a large field of view.
- This method utilizes a mirror mode transition sensitive to local electrostatic surface potentials, enabling broader application across materials, and has been successfully demonstrated on Si(111) surfaces and metal-semiconductor junctions.
Article Synopsis
- Charge transport in systems often depends on local features rather than a single global resistance value, highlighting the need for techniques that map local electronic potentials.
- A new potentiometry method using low-energy electron microscopy (LEEM) has been developed, which is fast, has a large field of view, and is non-invasive, but is limited by the availability of characteristic reflectivity features in some materials.
- The paper introduces an alternative low-energy electron potentiometry (LEEP) method based on a universal mirror mode transition, which is effective for a wider range of materials, and demonstrates its application in analyzing electrostatic surface potential variations and the Schottky effect in metal-semiconductor junctions.
Article Synopsis
- The electronic band structure of materials determines their properties by defining the allowed energy states for electrons.
- Measuring occupied bands is easy, but characterizing unoccupied bands (those above the Fermi level) has been challenging until now.
- The authors present a new technique using low-energy electron microscopy that can directly measure these unoccupied bands in graphene layers with high spatial resolution and potential application to various nanomaterials.
We present a study of the thickness dependence of magnetism and electrical conductivity in ultrathin La0.67Sr0.33MnO3 films grown on SrTiO3 (110) substrates.
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