Automated EEG artifact elimination by applying machine learning algorithms to ICA-based features.

Objective: Biological and non-biological artifacts cause severe problems when dealing with electroencephalogram (EEG) recordings. Independent component analysis (ICA) is a widely used method for eliminating various artifacts from recordings. However, evaluating and classifying the calculated independent components (IC) as artifact or EEG is not fully automated at present.

EEG artifact elimination by extraction of ICA-component features using image processing algorithms.

Artifact rejection is a central issue when dealing with electroencephalogram recordings. Although independent component analysis (ICA) separates data in linearly independent components (IC), the classification of these components as artifact or EEG signal still requires visual inspection by experts. In this paper, we achieve automated artifact elimination using linear discriminant analysis (LDA) for classification of feature vectors extracted from ICA components via image processing algorithms.