Solid-liquid interface of a 2-propanol-perfluoromethylcyclohexane mixture: from adsorption to wetting.

The liquid-solid interface between a silicon substrate and the binary mixture perfluoromethylcyclohexane (PFMC) and 2-propanol (IP) is examined by x-ray specular reflectivity and diffuse scattering under grazing angles. The wetting films between the PFMC-rich phase and the substrate are characterized with respect to the density profile and lateral fluctuations. We find that the liquid-liquid interface of the film is anomalously broadened as compared to capillary wave theory.

Nanometer-scale resolution of strain and interdiffusion in self-assembled InAs/GaAs quantum dots.

Tomographic nanometer-scale images of self-assembled InAs/GaAs quantum dots have been obtained from surface-sensitive x-ray diffraction. Based on the three-dimensional intensity mapping of selected regions in reciprocal space, the method yields the shape of the dots along with the lattice parameter distribution and the vertical interdiffusion profile on a subnanometer scale. The material composition is found to vary continuously from GaAs at the base of the dot to InAs at the top.

Investigation of Structure and Growth of Self-Assembled Polyelectrolyte Layers by X-ray and Neutron Scattering under Grazing Angles.

The structure of self-assembled polyelectrolyte thin films on float glass has been investigated by interface sensitive X-ray and neutron scattering methods. Special emphazis was given to the adsorption process of poly (ethylene imine) and polystyrole sulfonate as an important model system which is often used as a basis for subsequent multilayer buildup. From complementary X-ray and neutron reflectivity data, the vertical film density profile was derived for various growth parameters, including kinetic effects of different adsorption times.

Structure and normal incidence soft-x-ray reflectivity of Ni-Nb/C amorphous multilayers.

Multilayers for the water window region of the soft x rays have been prepared by pulsed laser ablation with amorphous Ni(50) Nb(50) and amorphous C. The structural characterization of the multilayers, period d = 2.41 nm, shows that the interfaces are sharp with a roughness of only 0.