Substrate effects on absorption of coated surfaces.

Photothermal deflection is used for mapping the absorption of bare and coated surfaces. The same area is mapped before and after coating and also after annealing. The great importance of the substrate with respect to the total losses of the coated component is emphasized.

Absorption mapping for characterization of glass surfaces.

The surface quality of bare substrates and preparation procedures take on an important role in optical coating performances. The most commonly used techniques of characterization generally give information about roughness and local defects. A photothermal deflection technique is used for mapping surface absorption of fused-silica and glass substrates.

Comparison of the properties of titanium dioxide films prepared by various techniques.

Fourteen university, government, and industrial laboratories prepared a total of twenty pairs of single-layer titanium dioxide films. Several laboratories analyzed the coatings to determine their optical properties, thickness, surface roughness, absorption, wetting contact angle, and crystalline structure. Wide variations were found in the optical and physical properties of the films, even among films produced by nominally the same deposition techniques.

Determination of the extinction coefficient of dielectric thin films from spectrophotometric measurements.

Data obtained from reflectance and transmittance measurements are used to determine the extinction coefficient. We show that accuracy is limited by the substrate quality and interface roughnesses of the layer.

In situ and air index measurements: influence of the deposition parameters on the shift of TiO2/SiO2 Fabry-Perot filters.

We measure the refractive index of thin films of TiO2 and SiO2 for given deposition parameters. Two complementary methods are used. The first is a postdeposition technique which uses the measurements of reflectance and transmittance in air.