Structural analysis of sulfuric acid solutions containing Ti and Mn using x-ray diffraction, x-ray absorption fine structure, and molecular dynamics simulation.

Structural analyses have been performed for sulfuric acid (HSO) aqueous solutions containing Ti and/or Mn. These solutions are used as the positive electrolyte in the Ti-Mn redox flow (RF) battery, in which it had been found that adding Ti in the positive electrolyte is very effective to reduce the MnO precipitation at a high state of charge. X-ray diffraction and x-ray absorption fine structure (XAFS) measurements were employed in order to obtain total correlation functions, T(r)'s, and coordination numbers around Mn and Ti in the solutions, respectively.

Chemical analysis of impurity boron atoms in diamond using soft X-ray emission spectroscopy.

To analyze the local structure and/or chemical states of boron atoms in boron-doped diamond, which can be synthesized by the microwave plasma-assisted chemical vapor deposition method (CVD-B-diamond) and the temperature gradient method at high pressure and high temperature (HPT-B-diamond), we measured the soft X-ray emission spectra in the CK and BK regions of B-diamonds using synchrotron radiation at the Advanced Light Source (ALS). X-ray spectral analyses using the fingerprint method and molecular orbital calculations confirm that boron atoms in CVD-B-diamond substitute for carbon atoms in the diamond lattice to form covalent B-C bonds, while boron atoms in HPT-B-diamond react with the impurity nitrogen atoms to form hexagonal boron nitride. This suggests that the high purity diamond without nitrogen impurities is necessary to synthesize p-type B-diamond semiconductors.

Local structure analyses around Er(3+) in Er-doped fibers with Al co-doping.

The local structure around Er(3+) in Er-doped optical fiber (EDFs) was explored by X-ray absorption fine structure (XAFS) measurements. Using several new approaches such as a novel sample preparation, we successfully measured the XAFS. The intensities near the 8.

Trace chemical characterization using monochromatic X-ray undulator radiation.

An efficient Johansson-type X-ray fluorescence spectrometer has been developed for advanced X-ray spectroscopic analysis with third-generation synchrotron radiation. Kalpha and Kbeta X-ray fluorescence spectra for trace metals have been collected by a Ge(220) analyzing crystal with a Rowland radius of 150 mm, under monochromatic X-ray excitation at the undulator beamline at the SPring-8. The energy resolution is approximately 10 eV for most of the K lines for 3d transition metals.