On the origins of fatigue strength in crystalline metallic materials.

Metallic materials experience irreversible deformation with increasing applied stress, manifested in localized slip events that result in fatigue failure upon repeated cycling. We discerned the physical origins of fatigue strength in a large set of face-centered cubic, hexagonal close-packed, and body-centered cubic metallic materials by considering cyclic deformation processes at nanometer resolution over large volumes of individual materials at the earliest stages of cycling. We identified quantitative relations between the yield strength and the ultimate tensile strength, fatigue strength, and physical characteristics of early slip localization events.

Multi-modal Dataset of a Polycrystalline Metallic Material: 3D Microstructure and Deformation Fields.

The development of high-fidelity mechanical property prediction models for the design of polycrystalline materials relies on large volumes of microstructural feature data. Concurrently, at these same scales, the deformation fields that develop during mechanical loading can be highly heterogeneous. Spatially correlated measurements of 3D microstructure and the ensuing deformation fields at the micro-scale would provide highly valuable insight into the relationship between microstructure and macroscopic mechanical response.

Multiplicity of dislocation pathways in a refractory multiprincipal element alloy.

Refractory multiprincipal element alloys (MPEAs) are promising materials to meet the demands of aggressive structural applications, yet require fundamentally different avenues for accommodating plastic deformation in the body-centered cubic (bcc) variants of these alloys. We show a desirable combination of homogeneous plastic deformability and strength in the bcc MPEA MoNbTi, enabled by the rugged atomic environment through which dislocations must navigate. Our observations of dislocation motion and atomistic calculations unveil the unexpected dominance of nonscrew character dislocations and numerous slip planes for dislocation glide.

Advanced detector signal acquisition and electron beam scanning for high resolution SEM imaging.

The advancement of materials science at the mesoscale requires improvements in both sampling volumes/areas and spatial resolution in order to make statistically significant measurements of microstructures that influence higher-order material properties, such as fatigue and fracture. Therefore, SEM-based techniques have become desirable due to improvements in imaging resolution, large sample handling capability, and flexibility for in-situ instrumentation. By using fast sampling of SEM electron detector signals, intrinsic beam scanning defects have been identified that are related to the response time of the SEM electron beam deflectors and electron detectors.

Transmission scanning electron microscopy: Defect observations and image simulations.

The new capabilities of a FEG scanning electron microscope (SEM) equipped with a scanning transmission electron microscopy (STEM) detector for defect characterization have been studied in parallel with transmission electron microscopy (TEM) imaging. Stacking faults and dislocations have been characterized in strontium titanate, a polycrystalline nickel-base superalloy and a single crystal cobalt-base material. Imaging modes that are similar to conventional TEM (CTEM) bright field (BF) and dark field (DF) and STEM are explored, and some of the differences due to the different accelerating voltages highlighted.