Multilayer x-ray mirror calibration by an energy dispersive method using an x-ray tube and a si(li) detector: absolute reflectivity, energy band pass, and overlapping order determination.

We describe under which conditions the x-ray energy dispersive method permits absolute reflectivity, energy band pass, and overlapping order determination on artificial multilayers. For such measurements a Si (Li) detector and a simple x-ray tube are used. Examples of experimental results on W/Si and Mo/Si x-ray mirrors are given for the photon energy range from 5 to 40 KeV.