Antimicrobial-induced DNA damage, and subsequent repair via upregulation of DNA repair factors, including error-prone translesion polymerases, can lead to the increased accumulation of mutations in the microbial genome, and ultimately increased risk of acquired mutations associated with antimicrobial resistance. While this phenotype is well described in bacterial species, it is less thoroughly investigated amongst microbial fungi. Here, we monitor DNA damage induced by antifungal agents in the fungal pathogen , and find that commonly used antifungal drugs are able to induce DNA damage, leading to the upregulation of transcripts encoding predicted error-prone polymerases and related factors.
View Article and Find Full Text PDFWe report a strength-enhanced waveguide second-order line-Bragg grating (WLBG) directly written with femtosecond laser in bulk glass by using "offset" to exploit the slow-light effect. This design eschews the use of multiple waveguides and/or waveguide bundles for light guiding. Instead, it only employs a single-laser-pass waveguide (SLPWG) with a refractive index change of 1.
View Article and Find Full Text PDFIntroduction: Lifelong adherence to a gluten-free diet (GFD) is the primary treatment of celiac disease (CeD), a gluten-driven enteropathy. Concerns have been raised about increased exposure to arsenic from a GFD because rice, which naturally bioaccumulates arsenic, is commonly used as a substitute for gluten-containing grains such as wheat. We hypothesize that arsenic exposure increases in newly diagnosed children with CeD after they adopt a GFD.
View Article and Find Full Text PDFMeasuring the 3D shape of semi-transparent surfaces with projector-camera 3D scanners is a difficult task because these surfaces weakly reflect light in a diffuse manner, and transmit a large part of the incident light. The task is even harder in the presence of participating background surfaces. The two methods proposed in this paper use sinusoidal patterns, each with a frequency chosen in the frequency range allowed by the projection optics of the projector-camera system.
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