Publications by authors named "Ingrid De Wolf"

Article Synopsis
  • As electronic devices get smaller and more complex, the effects of electromigration (EM) in interconnects become more significant, impacting their reliability and lifespan.
  • This paper presents a simulation framework to study EM in nano-interconnects, focusing on how metal microstructure affects atomic flux and stress distribution due to diffusion variations.
  • The study offers a novel method for creating realistic microstructures based on grain size data, advancing electromigration simulation by evaluating stress changes, void formation, and the effects of trench dimensions on copper interconnects, revealing optimal aspect ratios for extending EM lifetime.
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WA detailed thermal analysis of a hybrid, flip-chip InP-Si DFB laser is presented in this work. The lasers were experimentally tested at different operating temperatures, which allowed for deriving their thermal performance characteristics: the temperature dependence of threshold current, lasing slope, and output spectrum. Using these data, the laser thermal resistance was calculated ( = 75.

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This paper reports on 3D phase field simulations of IMC growth in Co/Sn and Cu/Sn solder systems. In agreement with experimental micrographs, we obtain uniform growth of the CoSn phase in Co/Sn solder joints and a non-uniform wavy morphology for the CuSn phase in Cu/Sn solder joints. Furthermore, simulations were performed to obtain an insight in the impact of Sn grain size, grain boundary versus bulk diffusion, IMC/Sn interface mobility and Sn grain boundary mobility on IMC morphology and growth kinetics.

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Microlenses are an important functional element of a modern imaging device. Typically, they are fabricated from organic materials on top of individual pixels. Though they are widely used, they do exhibit a number of limitations.

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