Quantitative characterization of the long-term charge storage of a ZnO-based nanorod array film through persistent photoconductance.

The persistent nature of the increased conductivity upon removal of incident illumination, described by the term persistent photoconductivity (PPC), in ZnO films is sensitive to their defect states. PPC can be viewed as a process of charge storage with relevant defects. To evaluate charge storage quantitatively, in this work, some thought-provoking characteristic quantities were derived from a photocurrent-time curve acquired by testing the photoelectric properties of ZnO under on and off UV illumination.