Fluorocarbon Plasma-Polymerized Layer Increases the Release Time of Silver Ions and the Antibacterial Activity of Silver-Based Coatings.

Silver-based antibacterial coatings limit the spread of hospital-acquired infections. Indeed, the use of silver and silver oxide nanoparticles (Ag and AgO NPs) incorporated in amorphous hydrogenated carbon (a-C:H) as a matrix demonstrates a promising approach to reduce microbial contamination on environmental surfaces. However, its success as an antibacterial coating hinges on the control of Ag release.

Secondary ion mass spectrometry, a powerful tool for revealing ink formulations and animal skins in medieval manuscripts.

Book production by medieval scriptoria have gained growing interest in recent studies. In this context, identifying ink compositions and parchment animal species from illuminated manuscripts is of great importance. Here, we introduce time-of-flight secondary ion mass spectrometry (ToF-SIMS) as a non-invasive tool to identify both inks and animal skins in manuscripts, at the same time.

Probing the human epidermis by combining ToF-SIMS and multivariate analysis.

The mammalian organism is continuously exposed to various biological and chemical threats from its surroundings. In order to provide protection against these threats, mammals have developed a specialized defense system at the interface with their environment. This system, known as the epidermis, is mainly composed of stratified keratinocytes organized in a complex self-renewing structure providing a mechanical and chemical barrier at the skin surface.

Binding Mechanisms Between Laser-Welded Polyamide-6.6 and Native Aluminum Oxide.

Nowadays, hybrid polymer/metal assemblies experience a growing demand in the industry, especially for transports and biomedical purposes. Those assemblies offer many advantages, such as lightweight structures and corrosion resistance. The main difficulty to assemble them remains.

Ion Implantation as an Approach for Structural Modifications and Functionalization of TiCT MXenes.

MXenes are a young family of two-dimensional transition metal carbides, nitrides, and carbonitrides with highly controllable structure, composition, and surface chemistry to adjust for target applications. Here, we demonstrate the modifications of two-dimensional MXenes by low-energy ion implantation, leading to the incorporation of Mn ions in TiCT (where T is a surface termination) thin films. Damage and structural defects caused by the implantation process are characterized at different depths by XPS on Ti 2p core-level spectra, by ToF-SIMS, and with electron energy loss spectroscopy analyses.

ZnO/Carbon xerogel photocatalysts by low-pressure plasma treatment, the role of the carbon substrate and its plasma functionalization.

ZnO is known to be photocatalytic, but with limited performances due to the strong electron-hole recombination after irradiation. The integration of ZnO nanomaterials on a conductive and high surface area carbon substrate is thus a potential alternative to obtain a significant improvement of the photocatalytic performance. Moreover, the carbon functionalization is expected to have a significant role in the adsorption/degradation mechanisms of dye, due to the difference in wettability or surface charge.

Comparison of the linking arm effect on the biological performance of a CD31 agonist directly grafted on L605 CoCr alloy by a plasma-based multistep strategy.

Stents are cardiovascular implants deployed on atherosclerotic arteries that aid in reopening, sustaining, and avoiding their collapse. Nevertheless, postimplantation complications exist, and the risk of the renewal of the plaque subsists. Therefore, enhanced properties are mandatory requirements for clinics.

ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment.

The advent of cluster ion beams has paved the way to the routine 3D analysis of organic heterojunctions. Alternatively, organic thin layers have also been successfully depth profiled with a low-energy cesium ion beam (Cs), to exploit the high chemical reactivity of cesium atoms, acting as free-radical scavengers. Despite of this, little is known about the depth resolution associated with low-energy Cs sputtering on organic multilayers.

Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions Beams.

Ion beam depth profiling is increasingly used to investigate layers and interfaces in complex multilayered devices, including solar cells. This approach is particularly challenging on hybrid perovskite layers and perovskite solar cells because of the presence of organic/inorganic interfaces requiring the fine optimization of the sputtering beam conditions. The ion beam sputtering must ensure a viable sputtering rate on hard inorganic materials while limiting the chemical (fragmentation), compositional (preferential sputtering) or topographical (roughening and intermixing) modifications on soft organic layers.

Surface modification and direct plasma amination of L605 CoCr alloys: on the optimization of the oxide layer for application in cardiovascular implants.

Stents are cardiovascular devices used to treat atherosclerosis, and are deployed into narrowed arteries and implanted by expansion to reopen the biological lumen. Nevertheless, complications after implantation are still observed in 10-14% of the implantations. Therefore, functionalizing these devices with active molecules to improve the interfacial effects with the surrounding tissue strongly impacts their success.

Hybrid Organic/Inorganic Materials Depth Profiling Using Low Energy Cesium Ions.

The structures developed in organic electronics, such as organic light emitting diodes (OLEDs) or organic photovoltaics (OPVs) devices always involve hybrid interfaces, joining metal or oxide layers with organic layers. No satisfactory method to probe these hybrid interfaces physical chemistry currently exists. One promising way to analyze such interfaces is to use in situ ion beam etching, but this requires ion beams able to depth profile both inorganic and organic layers.

Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers.

A major challenge regarding the characterization of multilayer films is to perform high-resolution molecular depth profiling of, in particular, organic materials. This experimental work compares the performance of C60(+) and Ar1700(+) for the depth profiling of model multilayer organic films. In particular, the conditions under which the original interface widths (depth resolution) were preserved were investigated as a function of the sputtering energy.

Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams.

With the recent developments in secondary ion mass spectrometry (SIMS), it is now possible to obtain molecular depth profiles and 3D molecular images of organic thin films, i.e. SIMS depth profiles where the molecular information of the mass spectrum is retained through the sputtering of the sample.

Behavior and evaluation of tetraalkylammonium bromides as instrument test materials in thermal desorption ion mobility spectrometers.

Ion mobility spectrometers have found widespread use for the screening of explosives, chemical warfare agents, and illicit drugs. These instruments often rely on drift-time calibrants to perform qualitative identification. Such calibrants are suitable to determine the reduced mobility of compounds, but may not necessarily provide information on instrument performance.

Comparative study of the usefulness of low energy Cs(+), Xe(+), and O(2)(+) ions for depth profiling amino-acid and sugar films.

This work reports a comparative study on the capability of low energy primary ion beams for depth profiling nonpolymeric molecules including amino-acid and sugar layers. Due to their different behavior regarding depth profiling, phenylalanine and trehalose molecules are chosen as reference systems. Each molecule was dissolved in suitable solvent prior to spin-coating on clean silicon wafer.

Molecular depth-profiling of polycarbonate with low-energy Cs+ ions.

In this work, we explored the possibility of performing molecular depth-profiling by using very low-energy (about 200 eV) monoatomic Cs(+) ions. We show, for the first time, that this simple approach is successful on polymer layers of polycarbonate (PC). Under 200 eV Cs(+) irradiation of PC, a fast decrease of all characteristic negatively charged molecular ion signals is first observed but, rather surprisingly, these signals reach a minimum before rising again.

Metal-assisted secondary ion mass spectrometry using atomic (Ga+, In+) and fullerene projectiles.

The advantages and drawbacks of using either monatomic or buckminsterfullerene primary ions for metal-assisted secondary ion mass spectrometry (MetA-SIMS) are investigated using a series of organic samples including additive molecules, polyolefins, and small peptides. Gold deposition is mostly performed by sputter-coating, and in some cases, the results are compared to those of thermal evaporation (already used in a previous article: Delcorte, A.; Médard, N.

ToF-SIMS characterization of thermal modifications of bixin from Bixa orellana fruit.

Bixa orellana fruit extracts were studied by time-of-flight secondary ion mass spectrometry (ToF-SIMS). The intensity of the peak at m/z 396, assigned to the bixin molecular ion plus two hydrogen atoms (C25H(32)O(4+), decreased as the extract was heated and nearly disappeared with heating above 150 degrees C. Simultaneously, the formation of dimers at m/z 790, 804, and 818 was observed.

Time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy analyses of Bixa orellana seeds.

Three different experiments were performed in order to obtain the major carotenoid composition of the natural colorant annatto (E160b) through ToF-SIMS (time-of-flight secondary ion mass spectrometry) and XPS (X-ray photoelectron spectroscopy) analyses. In the first experiment, Bixa orellana seeds aril as well as its interior part were analyzed. The analysis of the seeds aril by ToF-SIMS gives the colorant fingerprint without any sample treatment, showing the presence of bixin and its characteristic fragments.