Abnormal bipolar-like resistive changes are reported in TiO(2) thin films sandwiched between Pt top and bottom electrodes. The abnormal behavior is shown relying on the applied voltage range. That is, normal bipolar switching is also shown in the same sample with the optimized voltage range.
View Article and Find Full Text PDFAnalytical transmission electron microscopy (TEM) and scanning electron microscopy (SEM) have been applied for the characterization of evolution, lateral arrangements, orientations, and the microscopic nature of nanostructures formed during the early stages of ultrahigh vacuum electron beam evaporation of Cu onto surfaces of VSe2 layered crystals. Linear nanostructure of relatively large lateral dimension (100-500 nm) and networks of smaller nanostructures (lateral dimension: 15-30 nm; mesh sizes: 500-2000 nm) are subsequently formed on the substrate surfaces. Both types of nanostructures are not Cu nanowires but are composed of two strands of crystalline substrate material elevating above the substrate surface.
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