Publications by authors named "Hendrik Paetzelt"
Deflectometric profilometers based on industrial electronic autocollimators (ACs), as the ELCOMAT-3000, have become indispensable tools for precision form measurements of optical surfaces. A growing number of labs at synchrotron and free electron laser x-ray facilities are going for BESSY-II NOM-like versions of the AC-based profilometers. These tools have proven capable of characterizing state-of-the-art aspherical x-ray optics with an accuracy on the level of 100 nrad (root-mean-square) over the spatial frequency range limited by the size of the aperture used in the profilometer.
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- Researchers used scanning X-ray diffraction microscopy to study GaAs nanorods, which were grown without seeds through circular openings in a SiN(x) mask.
- The X-ray technique helped determine the strain state of individual nanorods and revealed detailed morphological characteristics.
- There were notable differences in shape, size, and strain state between rods located at the center and those at the edge of the periodic array.