Absolute calibration of a single-photon avalanche detector using a bright triggered single-photon source based on an InGaAs quantum dot.

We apply an InGaAs quantum dot based single-photon source for the absolute detection efficiency calibration of a silicon single-photon avalanche diode operating in Geiger mode. The single-photon source delivers up to (2.55 ± 0.

Improvement of the detection efficiency calibration and homogeneity measurement of Si-SPAD detectors.

Background: Silicon single-photon avalanche diodes (Si-SPADs) are the most used devices for measuring ultra-weak optical radiant fluxes in many quantum technology fields, such as quantum optics, quantum communication, quantum computing, etc. In all these fields, the detection efficiency is the main parameter, which has to be accurately known for achieving reliable measurements. In this paper we present the improvements performed on the setup described in López et al.

Detection efficiency calibration of single-photon silicon avalanche photodiodes traceable using double attenuator technique.

A highly accurate method for the determination of the detection efficiency of a silicon single-photon avalanche diode (Si-SPAD) is presented. This method is based on the comparison of the detected count rate of the Si-SPAD compared to the photon rate determined from a calibrated silicon diode using a modified attenuator technique, in which the total attenuation is measured in two attenuation steps. Furthermore, a validation of this two-step method is performed using attenuators of higher transmittance.