Planar Near-Field Measurements of Low-Sidelobe Antennas.

The planar near-field measurement technique is a proven technology for measuring ordinary antennas operating in the microwave region. The development of very low-sidelobe antennas raises the question whether this technique can be used to accurately measure these antennas. We show that data taken with an open-end waveguide probe and processed with the planar near-field methodology, including probe correction, can be used to accurately measure the sidelobes of very low-sidelobe antennas to levels of -55 dB to -60 dB relative to the main beam peak.