Publications by authors named "Haskell Taub"

We have investigated adsorption-induced deformation in graphene oxide framework materials (GOFs) using neutron diffraction at sample pressures up to 140 bar. GOFs, made by the solvothermal reaction of graphite oxide and benzene-1,4-diboronic acid, are a suitable candidate for deformation studies due to their narrow (∼1 nm), monodispersed, slit-shaped pores whose width can be measured by diffraction techniques. We have observed, in situ, a monotonic expansion of the slit width with increasing pressure upon adsorption of xenon, methane, and hydrogen under supercritical conditions.

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We present an experimental study of the micro- and mesoscopic structure of thin films of medium length n-alkane molecules on the native oxide layer of a silicon surface, prepared by dip-coating in a n-C32H66/n-heptane solution. Electron micrographs reveal two distinct adsorption morphologies depending on the substrate withdrawal speed v. For small v, dragonfly-shaped molecular islands are observed.

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We developed and characterized a Fabry-Pérot (FP) sensor module based micro gas chromatography (microGC) detector for multipoint on-column detection. The FP sensor was fabricated by depositing a thin layer of metal and a layer of gas-sensitive polymer consecutively on the endface of an optical fiber, which formed the FP cavity. Light partially reflected from the metal layer and the polymer-air interface generated an interference spectrum, which shifted as the polymer layer absorbed the gas analyte.

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Crystalline-to-rotator phase transitions have been widely studied in bulk hydrocarbons, in particular in normal alkanes. But few studies of these transitions deal with molecularly thin films of pure n-alkanes on solid substrates. In this work, we were able to grow dotriacontane (n-C(32)H(66)) films without coexisting bulk particles, which allows us to isolate the contribution to the ellipsometric signal from a monolayer of molecules oriented with their long axis perpendicular to the SiO(2) surface.

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We have used synchrotron X-ray reflectivity measurements to investigate the structure of n-dotriacontane (n-C(32)H(66) or C32) films deposited from the vapor phase onto a SiO(2)-coated Si(100) surface. Our primary motivation was to determine whether the structure and growth mode of these films differ from those deposited from solution on the same substrate. The vapor-deposited films had a thickness of approximately 50 A thick as monitored in situ by high-resolution ellipsometry and were stable in air.

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High-resolution ellipsometry and neutron diffraction measurements have been used to investigate the structure, growth, and wetting behavior of fluid pentane (n-C(5)H(12)) films adsorbed on graphite substrates. We present isotherms of the thickness of pentane films adsorbed on the basal-plane surfaces of a pyrolytic graphite substrate as a function of the vapor pressure. These isotherms are measured ellipsometrically for temperatures between 130 and 190 K.

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