Shear-Coated Linear Birefringent and Chiral Cellulose Nanocrystal Films Prepared from Non-Sonicated Suspensions with Different Storage Time.

Nanocelluloses are very attractive materials for creating structured films with unique optical properties using different preparation techniques. Evaporation-induced self-assembly of cellulose nanocrystals (CNC) aqueous suspensions produces iridescent films with selective circular Bragg reflection. Blade coating of sonicated CNC suspensions leads to birefringent CNC films.

Pitch profile across the cuticle of the scarab beetle determined by analysis of Mueller matrix measurements.

Helicoidal structures of lamellae of nanofibrils constitute the cuticle of some scarab beetles with iridescent metallic-like shine reflecting left-handed polarized light. The spectral and polarization properties of the reflected light depend on the pitch of the helicoidal structures, dispersion of effective refractive indices and thicknesses of layers in the cuticle. By modelling the outer exocuticle of the scarab beetle as a stack of continuously twisted biaxial slices of transparent materials, we extract optical and structural parameters by nonlinear regression analysis of variable-angle Mueller-matrix spectroscopic data.

Linear Birefringent Films of Cellulose Nanocrystals Produced by Dip-Coating.

Transparent films of cellulose nanocrystals (CNC) are prepared by dip-coating on glass substrates from aqueous suspensions of hydrolyzed filter paper. Dragging forces acting during films' deposition promote a preferential alignment of the rod-shaped CNC. Films that are 2.

Experimental degradation of helicoidal photonic nanostructures in scarab beetles (Coleoptera: Scarabaeidae): implications for the identification of circularly polarizing cuticle in the fossil record.

Scarab beetles (Coleoptera: Scarabaeidae) can exhibit striking colours produced by pigments and/or nanostructures. The latter include helicoidal (Bouligand) structures that can generate circularly polarized light. These have a cryptic evolutionary history in part because fossil examples are unknown.

Polarizing properties and structure of the cuticle of scarab beetles from the Chrysina genus.

The optical properties of several scarab beetles have been previously studied but few attempts have been made to compare beetles in the same genus. To determine whether there is any relation between specimens of the same genus, we have studied and classified seven species from the Chrysina genus. The polarization properties were analyzed with Mueller-matrix spectroscopic ellipsometry and the structural characteristics with optical microscopy and scanning electron microscopy.

Sum regression decomposition of spectral and angle-resolved Mueller matrices from biological reflectors.

We show spectroscopic Mueller-matrix data measured at multiple incidence angles of the scarab beetle C. aurata. A method of regression decomposition can decompose the Mueller matrix into a set of two matrices representing one polarizer and one dielectric reflector.

Simulation of light scattering from exoskeletons of scarab beetles.

An approach for simulation of light scattering from beetles exhibiting structural colors originating from periodic helicoidal structures is presented. Slight irregularities of the periodic structure in the exoskeleton of the beetles are considered as a major cause of light scattering. Two sources of scattering are taken into account: surface roughness and volume non-uniformity.

Scattering and polarization properties of the scarab beetle Cyphochilus insulanus cuticle.

Optical properties of natural photonic structures can inspire material developments in diversified areas, such as the spectral design of surfaces for camouflage. Here, reflectance, scattering, and polarization properties of the cuticle of the scarab beetle Cyphochilus insulanus are studied with spectral directional hemispherical reflectance, bidirectional reflection distribution function (BRDF) measurements, and Mueller-matrix spectroscopic ellipsometry (MMSE). At normal incidence, a reflectance (0.

Cuticle structure of the scarab beetle Cetonia aurata analyzed by regression analysis of Mueller-matrix ellipsometric data.

Since one hundred years it is known that some scarab beetles reflect elliptically and near-circular polarized light as demonstrated by Michelson for the beetle Chrysina resplendens. The handedness of the polarization is in a majority of cases left-handed but also right-handed polarization has been found. In addition, brilliant colors with metallic shine are observed.

Electronic and optical properties of nanocrystalline WO₃ thin films studied by optical spectroscopy and density functional calculations.

The optical and electronic properties of nanocrystalline WO3 thin films prepared by reactive dc magnetron sputtering at different total pressures (Ptot) were studied by optical spectroscopy and density functional theory (DFT) calculations. Monoclinic films prepared at low Ptot show absorption in the near infrared due to polarons, which is attributed to a strained film structure. Analysis of the optical data yields band-gap energies Eg ≈ 3.

Electromechanically tunable carbon nanofiber photonic crystal.

We demonstrate an electrically tunable 2D photonic crystal array constructed from vertically aligned carbon nanofibers. The nanofibers are actuated by applying a voltage between adjacent carbon nanofiber pairs grown directly on metal electrodes, thus dynamically changing the form factor of the photonic crystal lattice. The change in optical properties is characterized using optical diffraction and ellipsometry.

Addition of silica nanoparticles to tailor the mechanical properties of nanofibrillated cellulose thin films.

Over the last decade, the use of nanocellulose in advanced technological applications has been promoted both due the excellent properties of this material in combination with its renewability. In this study, multilayered thin films composed of nanofibrillated cellulose (NFC), polyvinyl amine (PVAm) and silica nanoparticles were fabricated on polydimethylsiloxane (PDMS) using a layer-by-layer adsorption technique. The multilayer build-up was followed in situ by quartz crystal microbalance with dissipation, which indicated that the PVAm-SiO(2)-PVAm-NFC system adsorbs twice as much wet mass material compared to the PVAm-NFC system for the same number of bilayers.

Highly anisotropic effective dielectric functions of silver nanoparticle arrays.

Variable-angle and Mueller matrix spectroscopic ellipsometry are used to determine the effective dielectric tensors of random and aligned silver nanoparticles and nanorods thin films. Randomly arranged particles are uniaxially anisotropic while aligned particles are biaxially anisotropic, with the anisotropy predominantly at the plasmonic resonances. The strong resonances in nanorod arrays result in the real part of the effective in-plane permittivities being opposite in sign over a significant range in the visible, suggesting the potential to design materials that display tunable negative-refraction.

Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching.

Silicon nanotips fabricated by electron cyclotron resonance plasma etching of silicon wafers are studied by spectroscopic ellipsometry. The structure of the nanotips is composed of columns 100-140 nm wide and spaced by about 200 nm. Ellipsometry data covering a wide spectral range from the midinfrared to the visible are described by modeling the nanotip layer as a graded uniaxial film using the Bruggeman effective medium approximation.

Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfaces.

Total internal reflection ellipsometry (TIRE) is used to study adsorption of human serum albumin and fibrinogen on thin gold films. TIRE shows very high sensitivity for protein monolayers adsorbed on metal surfaces when surface plasmon resonance effects are utilized. The measured data, expressed in ellipsometric angles psi and D are of several orders of magnitude larger in comparison with those from similar experiments performed with traditional ellipsometry.

Optimization of off-null ellipsometry in sensor applications.

The optimization of azimuth angle settings of a polarizer-compensator-sample-analyzer off-null ellipsometric sensor system to obtain maximum intensity changes with respect to changes in the properties of a sensing layer, with and without considering changes in s reflectance, is studied. Optimal conditions in the two cases are derived analytically under the assumption that linear relationships exist among the changes in the parameters of the sensing layer. The validity of these optimal conditions is verified by numerical examples.

Optimization of azimuth angle settings in polarizer-compensator-sample-analyzer off-null ellipsometry.

The dependence of the azimuth angle settings on the change in off-null intensity of a polarizer-compensator-sample-analyzer ellipsometer owing to changes in sample properties is studied. First, a closed-form expression for the relationship between azimuth angles that fulfill the null condition is presented. An approximation for the off-null light intensity near null that is valid for small changes of the p- and s-reflection coefficients of an isotropic sample is then derived.